Domain Knowledge Graph Construction Via A Simple Checker
Yueling Jenny Zeng, Li-C. Wang
arxiv 2310.04949

IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat
Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang
ITC 2023
Presentation video

Machine Learning Support for Wafer-Level Failure Pattern Analytics
Li-C. Wang, Yueling Jenny Zeng
Book Chapter

Wafer Map Pattern Analytics Driven By Natural Language Queries
Yueling Jenny Zeng, Min Jian Yang, Li-C. Wang
ITC Asia 2022

Language driven analytics for failure pattern feedforward and feedback
Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang
ITC 2022, Best Paper Award

MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification
Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan
ITC 2021

Learning A Wafer Feature With One Training Sample
Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa
ITC 2020, Best Paper Award